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02.04.2025

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TeDo Verlag GmbH Peter Ebert

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At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and of course various presentations.

Welcome & Keynote Session 1: 3D Scanner Session 2: Inline Metrology Session 3: Surface Metrology Session 4: CT & Xray Innovations presented by EMVA Panel Discussion

Welcome & Keynote

Session 1: 3D Scanner

Session 2: Inline Metrology

Session 3: Surface Metrology

Session 4: CT & Xray

Innovations presented by EMVA

Panel Discussion | Metrology Software

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