Webinars Videos Podcasts Events Help Contact
DE EN

Industrial Know-How Videos

Keynote: Unconventional Optical Metrology - New Possibilities Beyond Classical Systems
Category icon
02.04.2025

Image: Speaker

Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB Dr.-Ing. Johannes Meyer

Download certificate

Today's optical metrology systems typically employ classical lens systems, illumination components, and (AI) algorithms that are all optimized independently from each other. In this talk we will explore new ways of designing optical metrology system.

From the webinar: inVISION Day Metrology
Welcome & Keynote Session 1: 3D Scanner Session 2: Inline Metrology Session 3: Surface Metrology Session 4: CT & Xray Innovations presented by EMVA Panel Discussion

Welcome & Keynote

Session 1: 3D Scanner

Session 2: Inline Metrology

Session 3: Surface Metrology

Session 4: CT & Xray

Innovations presented by EMVA

Panel Discussion | Metrology Software

©Daenin/stock.adobe.com

Don't miss a thing!The Open Webinar World Program Update.

The most interesting topics: from automation to artificial intelligence. Don't miss a thing with our Open Webinar World program update.

* Required fields

Registration received. Please confirm your subscription in the confirmation email.

Upcoming TechTalksView all

| Webinars to watch
©peshkova/stock.adobe.com

Discover the Open Webinar World

In the Open Webinar World there are many features that make the experience with our webinars now even more comfortable. See for yourself what’s new here and take part in exciting topics from different areas.

Learn more