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Markerless Scanning. Flexible Capture. Direct On Device Inspection
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10.06.2026

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Shining 3D Niels Stenzel

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Experience the next generation of industrial 3D metrology with the FreeScan Omni and FreeScan Trak Nova from SHINING 3D. The presentation showcases wireless standalone metrology, markerless tracking, and real-time inspection directly on the device.

From the webinar: inVISION Day Metrology 2026
Welcome & Keynote Session 1: 3D Scanning Session 2: Automated Metrology Session 3: Surface Inspection Session 4: NDT & CT/X-Ray EMVA Innovations Panel Discussion: The Future of Metrology

Welcome & Keynote

Session 1: 3D Scanning

Session 2: Automated Metrology

Session 3: Surface Inspection

Session 4: NDT & CT/X-Ray

EMVA Innovations

Panel Discussion: The Future of Metrology

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