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ENG Presentation

15/06/2026

From Lab to Line: Surface Inspection for Automated Manufacturing

From the webinar: inVISION Day Metrology 2026

Mahr Mahr

Sebastian Conchi Sebastian Conchi

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Event Program for the Video

ENG Webinar

Dr.-Ing. Peter Ebert TeDo Verlag GmbH

00:04:06

Dr.-Ing. Peter Ebert TeDo Verlag GmbH

ENG Webinar
Welcome EMVA/Newston

At the Metrology Day online conference, the latest trends and products will be presented in four sessions (3D Scanning, Automated Metrology, Surface Inspection, and CT/X-Ray & NDT), providing a comprehensive overview of current market developments.

15/06/2026

ENG Presentation

Kai-Udo Modrich EMVA / Newston

00:04:06

Kai-Udo Modrich EMVA / Newston

ENG Presentation
Welcome EMVA/Newston

15/06/2026

ENG Presentation

Prof. Dr. Ing. Jörg Seewig RPTU

00:40:21

Prof. Dr. Ing. Jörg Seewig RPTU

ENG Presentation
Keynote: The Filter Toolbox ISO 16610 – Theory and Application Examples

The keynote provides an overview of the most important filters standardized in the current version of ISO 16610. The properties of the linear Gaussian filter, the linear spline filter and the robust Gaussian filter are discussed in detail.

15/06/2026

ENG Presentation

Armin Jehle AT Sensors

00:20:11

Armin Jehle AT Sensors

ENG Presentation
Boosting Time-to-Market in Industrial Metrology with AT 3D Laser Profilers

High-performance 3D laser profiler sensors from AT Sensors are providing precise and fast 3D images and pointclouds with high resolution and speed. AT Metrology Package is helping to develop the metrology application with calibration and measurem ...

15/06/2026

ENG Presentation

Niels Stenzel Shining 3D

00:22:53

Niels Stenzel Shining 3D

ENG Presentation
Markerless Scanning. Flexible Capture. Direct On Device Inspection

Experience the next generation of industrial 3D metrology with the FreeScan Omni and FreeScan Trak Nova from SHINING 3D. The presentation showcases wireless standalone metrology, markerless tracking, and real-time inspection directly on the device.

15/06/2026

ENG Presentation

Dr. Peter Kühmstedt Fraunhofer IOF

00:14:37

Dr. Peter Kühmstedt Fraunhofer IOF

ENG Presentation
3D shape measurement in vehicle crash tests and Grey-Box-Processing for efficient analysis

The systems goCRASH3D and goSPE3D enable high‑resolution 3D recording of a vehicle’s interior and exterior during crash tests. The captured data of deformations and movements are analyzed in combination with simulated data using a grey-box model.

15/06/2026

ENG Presentation

Ferenc Bögner und Fernando Schneider Kistler / AIT Goehner

00:24:43

Ferenc Bögner und Fernando Schneider Kistler / AIT Goehner

ENG Presentation
Metrology at Its Best with KiVision – Industrial dimensional measurement made easy

How can high-precision measurement technology be successfully transferred from the lab into industrial production? This session highlights the key challenges and shows how our software enables efficient image-processing solutions for industrial a ...

15/06/2026

ENG Presentation

Nico Schulze Eleven Dynamics

00:21:04

Nico Schulze Eleven Dynamics

ENG Presentation
The Future of Metrology Automation with EDAS

15/06/2026

ENG Presentation

Martina Blattl Bruker Alicona

00:18:30

Martina Blattl Bruker Alicona

ENG Presentation
Accuracy in Metrology or: Why Your Measurements Are Always Wrong

Accuracy sounds solid. In reality, it never is.This session takes a clear look at why “perfect” measurements don’t exist, what accuracy means in practice, and which factors shape your results. A concise perspective on getting closer to real ...

15/06/2026

ENG Presentation

Dr. Paul-Gerald Dittrich Opto GmbH

00:21:16

Dr. Paul-Gerald Dittrich Opto GmbH

ENG Presentation
Beyond the Visible-Within the Visible:Computational Imaging for Hidden Surface Information

Introduces RTI-based computational imaging for surface analysis. Using Opto's new revolutionary solino®, the workflow, software, industrial applications, and AI-based extensions are presented. Experience how advanced surface inspection can be re ...

15/06/2026

ENG Presentation

Hüseyin Serbes Metubiq

00:21:28

Hüseyin Serbes Metubiq

ENG Presentation
From Vibration Suppression to Vibration Awareness in White-Light Interferometry

Conventional approaches attempt to suppress vibrations through isolation or stabilization. We present a measurement-driven compensation strategy that makes vibrations observable and correctable, enabling robust white-light interferometry beyond t ...

15/06/2026

ENG Presentation

Lorenz Butzhammer Universität Erlangen-Nürnberg Lehrstuhl für Fertigungsmesstechnik

00:20:53

Lorenz Butzhammer Universität Erlangen-Nürnberg Lehrstuhl für Fertigungsmesstechnik

ENG Presentation
Higher measurement accuracy for fast CT scans through task-driven view-angle optimization

Reducing the number of X-ray projections shortens measurement times in industrial CT, but often increases measurement errors. This talk presents a method for optimizing rotary table angles to improve the measurement accuracy with fewer images.

15/06/2026

ENG Presentation

Dipl.-Ing. Tristan Schubert Werth Messtechnik

00:21:22

Dipl.-Ing. Tristan Schubert Werth Messtechnik

ENG Presentation
Process Reliability and Traceability Instead of Hallucinating AI Analyses

How reliable is AI really in industrial metrology? This presentation uses practical examples to show where AI-based evaluation of measurement data already provides clear added value and where its limitations lie. The focus is on the comparison wi ...

15/06/2026

ENG Presentation

Verena Pietzsch Wenzel Group

00:25:10

Verena Pietzsch Wenzel Group

ENG Presentation
Load. Select. Scan – Automated CT Metrology

This talk demonstrates how WENZEL implements an automated CT metrology workflow combining system integration, automation, and inspection software for streamlined use directly on the shop floor by non-expert operators.

15/06/2026

ENG Presentation

Dr Roland Terborg / Iris Cusini Shinephi

00:10:58

Dr Roland Terborg / Iris Cusini Shinephi

ENG Presentation
Real-time, nanoscale optical metrology for advanced manufacturing

We enable non-destructive highly-stable inspection for the semiconductor industry. Our patented add-on module transforms imaging systems into high-precision tools, delivering sub-nanometer vertical sensitivity in real time.

15/06/2026

ENG Presentation

Serge Carras Altimet

00:11:02

Serge Carras Altimet

ENG Presentation
Surface Metrology from mm to nm

ALTIMET is a leading provider of metrology machines combining 3D VISION CMM and SURFACE texture as 4D! technology. The company established in 2004' has supplied hundreds of advanced metrology platforms to pionneer large accounts worldwide refere ...

15/06/2026

ENG Presentation

Jérôme Ligot Optrion

00:09:42

Jérôme Ligot Optrion

ENG Presentation
Robotic Shearography for Automated NDT: DeFinder 4300 Series in Action

Optrion will present the DeFinder 4300 series, a shearography system for fast, non-contact NDT. The talk will highlight robotic inspection workflows and stitching capabilities for larger, more complex industrial parts.

15/06/2026

ENG Presentation

Christian Farmer Weldmetrix

00:14:07

Christian Farmer Weldmetrix

ENG Presentation
Real-Time Weld Inspection based on reflected light measurement

15/06/2026

ENG Presentation

Stefan Hoheisel FARO|Creaform

00:48:37

Stefan Hoheisel FARO|Creaform

ENG Presentation
Metrology Day 2026 Panel Discussion

15/06/2026

From Lab to Line: Surface Inspection for Automated Manufacturing

Event Program for the Video

ENG Webinar Welcome EMVA/Newston

ENG Presentation Welcome EMVA/Newston

ENG Presentation Keynote: The Filter Toolbox ISO 16610 – Theory and Application Examples

ENG Presentation Boosting Time-to-Market in Industrial Metrology with AT 3D Laser Profilers

ENG Presentation Markerless Scanning. Flexible Capture. Direct On Device Inspection

ENG Presentation 3D shape measurement in vehicle crash tests and Grey-Box-Processing for efficient analysis

ENG Presentation Metrology at Its Best with KiVision – Industrial dimensional measurement made easy

ENG Presentation The Future of Metrology Automation with EDAS

ENG Presentation Accuracy in Metrology or: Why Your Measurements Are Always Wrong

ENG Presentation Beyond the Visible-Within the Visible:Computational Imaging for Hidden Surface Information

ENG Presentation From Vibration Suppression to Vibration Awareness in White-Light Interferometry

ENG Presentation Higher measurement accuracy for fast CT scans through task-driven view-angle optimization

ENG Presentation Process Reliability and Traceability Instead of Hallucinating AI Analyses

ENG Presentation Load. Select. Scan – Automated CT Metrology

ENG Presentation Real-time, nanoscale optical metrology for advanced manufacturing

ENG Presentation Surface Metrology from mm to nm

ENG Presentation Robotic Shearography for Automated NDT: DeFinder 4300 Series in Action

ENG Presentation Real-Time Weld Inspection based on reflected light measurement

ENG Presentation Metrology Day 2026 Panel Discussion

Additional Presentations

Welcome EMVA/Newston

Welcome EMVA/Newston

Keynote: The Filter Toolbox ISO 16610 – Theory and Application Examples

Boosting Time-to-Market in Industrial Metrology with AT 3D Laser Profilers

Markerless Scanning. Flexible Capture. Direct On Device Inspection

3D shape measurement in vehicle crash tests and Grey-Box-Processing for effi ...

Metrology at Its Best with KiVision – Industrial dimensional measurement m ...

The Future of Metrology Automation with EDAS

Accuracy in Metrology or: Why Your Measurements Are Always Wrong

Beyond the Visible-Within the Visible:Computational Imaging for Hidden Surfa ...

From Vibration Suppression to Vibration Awareness in White-Light Interferometry

Higher measurement accuracy for fast CT scans through task-driven view-angle ...

Process Reliability and Traceability Instead of Hallucinating AI Analyses

Load. Select. Scan – Automated CT Metrology

Real-time, nanoscale optical metrology for advanced manufacturing

Surface Metrology from mm to nm

Robotic Shearography for Automated NDT: DeFinder 4300 Series in Action

Real-Time Weld Inspection based on reflected light measurement

Metrology Day 2026 Panel Discussion

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ENG Webinar
Welcome EMVA/Newston

ENG Presentation
Welcome EMVA/Newston

ENG Presentation
Keynote: The Filter Toolbox ISO 16610 – Theory and Application Examples

ENG Presentation
Boosting Time-to-Market in Industrial Metrology with AT 3D Laser Profilers

ENG Presentation
Markerless Scanning. Flexible Capture. Direct On Device Inspection

ENG Presentation
3D shape measurement in vehicle crash tests and Grey-Box-Processing for efficient analysis

ENG Presentation
Metrology at Its Best with KiVision – Industrial dimensional measurement made easy

ENG Presentation
The Future of Metrology Automation with EDAS

ENG Presentation
Accuracy in Metrology or: Why Your Measurements Are Always Wrong

ENG Presentation
Beyond the Visible-Within the Visible:Computational Imaging for Hidden Surface Information

ENG Presentation
From Vibration Suppression to Vibration Awareness in White-Light Interferometry

ENG Presentation
Higher measurement accuracy for fast CT scans through task-driven view-angle optimization

ENG Presentation
Process Reliability and Traceability Instead of Hallucinating AI Analyses

ENG Presentation
Load. Select. Scan – Automated CT Metrology

ENG Presentation
Real-time, nanoscale optical metrology for advanced manufacturing

ENG Presentation
Surface Metrology from mm to nm

ENG Presentation
Robotic Shearography for Automated NDT: DeFinder 4300 Series in Action

ENG Presentation
Real-Time Weld Inspection based on reflected light measurement

ENG Presentation
Metrology Day 2026 Panel Discussion