Webinars Videos Podcasts Events Help Contact
DE EN

Industrial Know-How Videos

Real-time, nanoscale optical metrology for advanced manufacturing
Category icon
10.06.2026

Image: Speaker

Shinephi Dr Roland Terborg / Iris Cusini

Download certificate

We enable non-destructive highly-stable inspection for the semiconductor industry. Our patented add-on module transforms imaging systems into high-precision tools, delivering sub-nanometer vertical sensitivity in real time.

From the webinar: inVISION Day Metrology 2026
Welcome & Keynote Session 1: 3D Scanning Session 2: Automated Metrology Session 3: Surface Inspection Session 4: NDT & CT/X-Ray EMVA Innovations Panel Discussion: The Future of Metrology

Welcome & Keynote

Session 1: 3D Scanning

Session 2: Automated Metrology

Session 3: Surface Inspection

Session 4: NDT & CT/X-Ray

EMVA Innovations

Panel Discussion: The Future of Metrology

©Daenin/stock.adobe.com

Don't miss a thing!The Open Webinar World Program Update.

The most interesting topics: from automation to artificial intelligence. Don't miss a thing with our Open Webinar World program update.

* Required fields

Registration received. Please confirm your subscription in the confirmation email.

Upcoming TechTalksView all

| Webinars to watch
©peshkova/stock.adobe.com

Discover the Open Webinar World

In the Open Webinar World there are many features that make the experience with our webinars now even more comfortable. See for yourself what’s new here and take part in exciting topics from different areas.

Learn more