Electronics

Bild: ©xiaoliangge/stock.adobe.com / Precitec Optronik GmbH

webinar-language-icon 31.10.2023

2:00 PM (CET)

There are completely different systems for inspecting electronic components and wafers, some of which will be briefly presented in the following webinar. This ranges from AOI systems to thermography or fast metrology or machine vision systems.

Moderation:

Dr. -Ing. Peter Ebert

Topics:

InfraTec
Thermographic Measurements for Reliable Electronics Design and Operation
Vision & Control
Telecentric Optical Systems for End-of-Line (EoL) Inspection in Electronics Manufacturing
Opto GmbH
New image-based metrology technologies to automate semiconductor test processes

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