Popular

60 Minutes

English

Free

Electronics

Webinar - Featureimage

Bild: ©xiaoliangge/stock.adobe.com / Precitec Optronik GmbH

webinar-language-icon31.10.2023

2:00 PM (CET)

There are completely different systems for inspecting electronic components and wafers, some of which will be briefly presented in the following webinar. This ranges from AOI systems to thermography or fast metrology or machine vision systems.

Webinar - Moderator-image

Moderation:

Dr. -Ing. Peter Ebert

Topics:

  • Referent-Logo

    InfraTec

    Thermographic Measurements for Reliable Electronics Design and Operation

  • Referent-Logo

    Vision & Control

    Telecentric Optical Systems for End-of-Line (EoL) Inspection in Electronics Manufacturing

  • Referent-Logo

    Opto GmbH

    New image-based metrology technologies to automate semiconductor test processes