inVISION Day Metrology 2026

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10/06/2026

9:15 AM (CET)

Moderation:

Dr.-Ing. Peter Ebert

Topics:

EMVA

Welcome
RPTU

Keynote: The Filter Toolbox ISO 16610 for Surface Topography – Theory & Application Exampl
AT Sensors

Topic of the referent to be announced
Bruker Alicona

Topic of the referent to be announced
Eleven Dynamics

Topic of the referent to be announced
Werth Messtechnik

Topic of the referent to be announced
To be announced

Topic of the referent to be announced
FARO|Creaform

Topic of the referent to be announced
Fraunhofer IPM

Topic of the referent to be announced
VisiConsult

Topic of the referent to be announced
Zeiss

Topic of the referent to be announced
AT Sensors

Topic of the referent to be announced
Further presentation topics and speakers will be announced later.

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