inVISION Day Metrology 2026

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ENG

10/06/2026

9:15 a.m. (CEST)

At the Metrology Day online conference, the latest trends and products will be presented in four sessions (3D Scanning, Automated Metrology, Surface Inspection, and CT/X-Ray & NDT), providing a comprehensive overview of current market developments.

Moderation:

Dr.-Ing. Peter Ebert

EMVA / Newston

Welcome

RPTU

Keynote: The Filter Toolbox ISO 16610 – Theory and Application Examples

AT Sensors

Boosting Time-to-Market in Industrial Metrology with AT 3D Laser Profilers

Shining 3D

Markerless Scanning. Flexible Capture. Direct On Device Inspection.

Fraunhofer IOF

3D shape measurement in vehicle crash tests and Grey-Box-Processing for efficient analysis

Kistler / AIT Goehner

Metrology at Its Best with KiVision – Industrial dimensional measurement made easy

Eleven Dynamics

The Future of Metrology Automation with EDAS

Mahr

From Lab to Line: Surface Inspection for Automated Manufacturing

Bruker Alicona

Accuracy in Metrology or: Why Your Measurements Are Always Wrong

Opto GmbH

Beyond the Visible-Within the Visible:Computational Imaging for Hidden Surface Information

Metubiq

From Vibration Suppression to Vibration Awareness in White-Light Interferometry

Universität Erlangen-Nürnberg Lehrstuhl für Fertigungsmesstechnik

Higher measurement accuracy for fast CT scans through task-driven view-angle optimization

Werth Messtechnik

Process Reliability and Traceability Instead of Hallucinating AI Analyses

Wenzel Group

Load. Select. Scan – Automated CT Metrology

Shinephi

Real-time, nanoscale optical metrology for advanced manufacturing

Altimet

Surface Metrology from mm to nm

Optrion

Robotic Shearography for Automated NDT: DeFinder 4300 Series in Action

Weldmetrix

Real-Time Weld Inspection based on reflected light measurement

FARO|Creaform