inVISION Day Metrology
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02/04/2025
9:00 AM (CET)
At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and of course various presentations.

Moderation:
Peter Ebert
EMVA
Welcome
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Keynote: Unconventional Optical Metrology – New Possibilities Beyond Classical Systems
Photoneo
3D -scanners for vision guided robotics
Protos-3D Metrology GmbH
Automated Virtual Clamping for Zeiss ScanBox Technology
Me-go
High-Speed 3D Scanning
Eleven Dynamics
AI Cameras are Redefining how Manufacturers detect Defects & ensure Quality
Fraunhofer IPM
Inline Roughness Measurement Using Laser Speckle Correlation
Mahr
Effective, fast, precise optical surface measurment with confocale microscopes
Bruker Alicona
One Click Roughness Measurements
Tenta Vision
Camera Tomography: Laser Speckle Interferometry to Detect Internal Defects
Lumafield
Production Ready CT Scans in 0.1sec
Ommatidia Lidar
High-precision parallel LiDAR technology for high-resolution measurements
Resoniks
Acoustic quality inspection, tailored for cast, forged, or welded metal parts
Dive Imaging
World’s first fully integrated one-button bench-top Hyperspectral Vision System
NEWSTON Automated Solutions GmbH
NEWSTON Automated Solutions Inline Inspection & Metrology – From corporate to stand alone
Eleven Dynamics / Duwe-3D / Hexagon / Zeiss
Virtual Clamping – The End of Physical Measurement Fixtures?
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