Metrology (TechTalk XL: Two Hours)

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webinar-language-icon 28/10/2025

2:00 PM (CET)

There are numerous methods for 2D/3D metrology, such as 3D scanners, inline metrology, surface inspection, CT&X-Ray,..... The webinar presents three solutions and the corresponding technologies and gives numerous application examples.

Moderation:

Dr.-Ing. Peter Ebert

Topics:

Zeiss

Topic of the referent to be announced
Visometry

Topic of the referent to be announced
Further presentation topics and speakers will be announced later.

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