Dr.-Ing. Peter Ebert TeDo Verlag GmbH
Dr.-Ing. Peter Ebert TeDo Verlag GmbH
Welcome EMVA/NewstonAt the Metrology Day online conference, the latest trends and products will be presented in four sessions (3D Scanning, Automated Metrology, Surface Inspection, and CT/X-Ray & NDT), providing a comprehensive overview of current market developments.
Christian Farmer Weldmetrix
Christian Farmer Weldmetrix
Real-Time Weld Inspection based on reflected light measurement
Jérôme Ligot Optrion
Jérôme Ligot Optrion
Robotic Shearography for Automated NDT: DeFinder 4300 Series in ActionOptrion will present the DeFinder 4300 series, a shearography system for fast, non-contact NDT. The talk will highlight robotic inspection workflows and stitching capabilities for larger, more complex industrial parts.
Serge Carras Altimet
Serge Carras Altimet
Surface Metrology from mm to nmALTIMET is a leading provider of metrology machines combining 3D VISION CMM and SURFACE texture as 4D! technology. The company established in 2004' has supplied hundreds of advanced metrology platforms to pionneer large accounts worldwide references.
Dr Roland Terborg / Iris Cusini Shinephi
Dr Roland Terborg / Iris Cusini Shinephi
Real-time, nanoscale optical metrology for advanced manufacturingWe enable non-destructive highly-stable inspection for the semiconductor industry. Our patented add-on module transforms imaging systems into high-precision tools, delivering sub-nanometer vertical sensitivity in real time.
Verena Pietzsch Wenzel Group
Verena Pietzsch Wenzel Group
Load. Select. Scan – Automated CT MetrologyThis talk demonstrates how WENZEL implements an automated CT metrology workflow combining system integration, automation, and inspection software for streamlined use directly on the shop floor by non-expert operators.
Dipl.-Ing. Tristan Schubert Werth Messtechnik
Dipl.-Ing. Tristan Schubert Werth Messtechnik
Process Reliability and Traceability Instead of Hallucinating AI AnalysesHow reliable is AI really in industrial metrology? This presentation uses practical examples to show where AI-based evaluation of measurement data already provides clear added value and where its limitations lie. The focus is on the comparison with analytical
Lorenz Butzhammer Universität Erlangen-Nürnberg Lehrstuhl für Fertigungsmesstechnik
Lorenz Butzhammer Universität Erlangen-Nürnberg Lehrstuhl für Fertigungsmesstechnik
Higher measurement accuracy for fast CT scans through task-driven view-angle optimizationReducing the number of X-ray projections shortens measurement times in industrial CT, but often increases measurement errors. This talk presents a method for optimizing rotary table angles to improve the measurement accuracy with fewer images.
Hüseyin Serbes Metubiq
Hüseyin Serbes Metubiq
From Vibration Suppression to Vibration Awareness in White-Light InterferometryConventional approaches attempt to suppress vibrations through isolation or stabilization. We present a measurement-driven compensation strategy that makes vibrations observable and correctable, enabling robust white-light interferometry beyond the laboratory.
Dr. Paul-Gerald Dittrich Opto GmbH
Dr. Paul-Gerald Dittrich Opto GmbH
Beyond the Visible-Within the Visible:Computational Imaging for Hidden Surface InformationIntroduces RTI-based computational imaging for surface analysis. Using Opto's new revolutionary solino®, the workflow, software, industrial applications, and AI-based extensions are presented. Experience how advanced surface inspection can be realized.
Martina Blattl Bruker Alicona
Martina Blattl Bruker Alicona
Accuracy in Metrology or: Why Your Measurements Are Always WrongAccuracy sounds solid. In reality, it never is.This session takes a clear look at why “perfect” measurements don’t exist, what accuracy means in practice, and which factors shape your results. A concise perspective on getting closer to reality in metrology.
Sebastian Conchi Mahr
Sebastian Conchi Mahr
From Lab to Line: Surface Inspection for Automated Manufacturing
Nico Schulze Eleven Dynamics
Nico Schulze Eleven Dynamics
The Future of Metrology Automation with EDAS
Ferenc Bögner und Fernando Schneider Kistler / AIT Goehner
Ferenc Bögner und Fernando Schneider Kistler / AIT Goehner
Metrology at Its Best with KiVision – Industrial dimensional measurement made easyHow can high-precision measurement technology be successfully transferred from the lab into industrial production? This session highlights the key challenges and shows how our software enables efficient image-processing solutions for industrial applications.
Dr. Peter Kühmstedt Fraunhofer IOF
Dr. Peter Kühmstedt Fraunhofer IOF
3D shape measurement in vehicle crash tests and Grey-Box-Processing for efficient analysisThe systems goCRASH3D and goSPE3D enable high‑resolution 3D recording of a vehicle’s interior and exterior during crash tests. The captured data of deformations and movements are analyzed in combination with simulated data using a grey-box model.
HIMA Group / KI-generiert
18.11.2026
11:00 Uhr (MEZ)
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12.11.2026
11:00 Uhr (MEZ)
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05.11.2026
11:00 Uhr (MEZ)
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11.11.2026
11:00 Uhr (MEZ)
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04.11.2026
14:00 Uhr (MEZ)
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04.11.2026
11:00 Uhr (MEZ)
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10.11.2026
11:00 Uhr (MEZ)
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05.11.2026
14:00 Uhr (MEZ)
Bild: ©U-STUDIOGRAPHY DD59/stock.adobe.com
21.10.2026
11:00 Uhr (MESZ)
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08.10.2026
11:00 Uhr (MESZ)
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