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ENG Referat

08.04.2025

High-precision parallel LiDAR technology for high-resolution measurements

Aus dem Webinar: inVISION Day Metrology

Ommatidia Lidar Ommatidia Lidar

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Eventprogramm zum Video

ENG Webinar

Peter Ebert TeDo Verlag GmbH

00:05:06

Peter Ebert TeDo Verlag GmbH

ENG Webinar
Welcome

At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel ...

07.04.2025

ENG Referat

Dr.-Ing. Johannes Meyer Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB

00:43:39

Dr.-Ing. Johannes Meyer Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB

ENG Referat
Keynote: Unconventional Optical Metrology – New Possibilities Beyond Classical Systems

Today's optical metrology systems typically employ classical lens systems, illumination components, and (AI) algorithms that are all optimized independently from each other. In this talk we will explore new ways of designing optical metrology system.

07.04.2025

ENG Referat

Patrik Daniel Photoneo

00:22:17

Patrik Daniel Photoneo

ENG Referat
Enhancing 3D Metrology in Logistics and Vision Guided Robotics with 3D Sensors

This talk will explore the applications of the MotionCam-3D Color sensor, a state-of-the-art 3D sensor that delivers high-quality data even in dynamic or non-stationary environments.

07.04.2025

ENG Referat

Hermann Eiblmeier Protos-3D Metrology GmbH

00:15:44

Hermann Eiblmeier Protos-3D Metrology GmbH

ENG Referat
Automated Virtual Clamping for ZEISS ScanBox Technology

Vorstellung von zwei automatisierten Standardprodukten (PRAFS 3620 und PRAFS 2410) aus dem Hause PROTOS-3D Metrology GmbH. Die PRAFS 3620 ist ein etabliertes Produkt für die ScanBoxen SB6X, SB72X, SB82X / SB83X von ZEISS und als neueste Erweiterung.

07.04.2025

ENG Referat

Thomas Lind Me-go

00:18:08

Thomas Lind Me-go

ENG Referat
3D – Scanning with laser or fringe projection – What is better?

3D scanning market is growing, and more and more manufacturers are entering the industrial markets with new products. But what are the differences, and which system is best for me?

07.04.2025

ENG Referat

Q&A Session 1: 3D Scanner Photoneo, Protos-3D Metrology GmbH, Me-go

00:07:04

Q&A Session 1: 3D Scanner Photoneo, Protos-3D Metrology GmbH, Me-go

ENG Referat
Q&A Session 1

07.04.2025

ENG Referat

Petra Thanner AIT Austrian Institute of Technology GmbH

00:19:39

Petra Thanner AIT Austrian Institute of Technology GmbH

ENG Referat
Inline 3D-Microsopy with up to 60 Mio points per second

The ici:microscopy technology from the AIT Austrian Institute of Technology, Vienna, enables combined 2D and 3D inspection in microscopy for 100% inline quality control for the first time.

07.04.2025

ENG Referat

Stefan Horvath Eleven Dynamics

00:26:41

Stefan Horvath Eleven Dynamics

ENG Referat
AI Cameras are Redefining how Manufacturers detect Defects & ensure Quality

07.04.2025

ENG Referat

Q&A Session 2: Inline Metrology AIT Austrian Institute of Technology GmbH, Eleven Dynamics

00:08:17

Q&A Session 2: Inline Metrology AIT Austrian Institute of Technology GmbH, Eleven Dynamics

ENG Referat
Q&A Session 2

07.04.2025

ENG Referat

Patrick Laux Fraunhofer IPM

00:20:22

Patrick Laux Fraunhofer IPM

ENG Referat
Inline Roughness Measurement Using Laser Speckle Correlation

08.04.2025

ENG Referat

Sebastian Conchi Mahr

00:22:45

Sebastian Conchi Mahr

ENG Referat
Optosurf – Scattered Light Measurement for Roughness, Form and Waviness.

In times of high-tech competition, components and their manufacturing must be realised to be faster, more precise and more cost- efficient.

08.04.2025

ENG Referat

Kevin Mathy Bruker Alicona

00:25:40

Kevin Mathy Bruker Alicona

ENG Referat
Taming the Beast of Roughness Measurement – With Just One Click

Forget the fear of complex surface analysis. With One Click Roughness, Bruker Alicona makes roughness measurement so easy, it’s almost unfair.

08.04.2025

ENG Referat

Dr. Klaus Illgner K-Lens

00:16:06

Dr. Klaus Illgner K-Lens

ENG Referat
High-level 3D surface analysis with true color coded 3D point clouds (RGBD)

The talk introduces a unique light field lens which enables a single camera to shot several perspectives of an object with a single exposre. Based on this information accurate RGB pointclouds can be calculated. E

08.04.2025

ENG Referat

Q&A Session 3: Surface Metrology Fraunhofer IPM, Mahr, Bruker Alicona, K-Lens

00:03:14

Q&A Session 3: Surface Metrology Fraunhofer IPM, Mahr, Bruker Alicona, K-Lens

ENG Referat
Q&A Session 3

08.04.2025

ENG Referat

Dr. Uwe Hilpert Wenzel Metrology

00:23:16

Dr. Uwe Hilpert Wenzel Metrology

ENG Referat
Latest Developement in CT Metrology

The lecture shows new fields of CT in the field of metrology. In particular, the application of CT in gear metrology.

08.04.2025

ENG Referat

Dr. Cristopher Petry Tenta Vision

00:25:22

Dr. Cristopher Petry Tenta Vision

ENG Referat
Camera Tomography: A new method to detect external & internal defects in-line

Camera Tomography detects external and internal defects in milliseconds. The compact systems integrate seamlessly into any machine without protective enclosures and operate like vision technology.

08.04.2025

ENG Referat

Dr. Sarah Kobašlija Lumafield

00:21:57

Dr. Sarah Kobašlija Lumafield

ENG Referat
Production Ready CT Scans in 0.1sec

Industrial CT scanning delivers unmatched visibility into internal structures—critical for catching defects, verifying assemblies, and ensuring product quality: with Lumafield’s Triton system and ultra-fast CT technology.

08.04.2025

ENG Referat

Nikola Nikolov Resoniks

00:10:50

Nikola Nikolov Resoniks

ENG Referat
Beyond Visual Inspection: AI-powered Acoustic Testing for Structural Metal Defects

Firstly, the introduction will be about our company (Resoniks) and markets we are currently in and the challenges we are tackling.

08.04.2025

ENG Referat

Dr. Wulf Grählert Dive Imaging

00:10:17

Dr. Wulf Grählert Dive Imaging

ENG Referat
Hyperspectral Vision – Fast optical metrology for thin layers and surfaces

DIVE’s Hyperspectral Vision technology empowers manufacturers with end-to-end solutions to ensure quality, functionality, and cost-efficiency.

08.04.2025

ENG Referat

Dr. Kai-Udo Modrich NEWSTON Automated Solutions GmbH

00:10:51

Dr. Kai-Udo Modrich NEWSTON Automated Solutions GmbH

ENG Referat
Inline Inspection & Metrology – From corporate to stand alone

08.04.2025

ENG Referat

Eleven Dynamics / Duwe-3D / Hexagon / Zeiss

00:48:16

Eleven Dynamics / Duwe-3D / Hexagon / Zeiss

ENG Referat
Virtual Clamping – The End of Physical Measurement Fixtures?

08.04.2025

High-precision parallel LiDAR technology for high-resolution measurements

Eventprogramm zum Video

ENG Webinar Welcome

ENG Referat Keynote: Unconventional Optical Metrology – New Possibilities Beyond Classical Systems

ENG Referat Enhancing 3D Metrology in Logistics and Vision Guided Robotics with 3D Sensors

ENG Referat Automated Virtual Clamping for ZEISS ScanBox Technology

ENG Referat 3D – Scanning with laser or fringe projection – What is better?

ENG Referat Q&A Session 1

ENG Referat Inline 3D-Microsopy with up to 60 Mio points per second

ENG Referat AI Cameras are Redefining how Manufacturers detect Defects & ensure Quality

ENG Referat Q&A Session 2

ENG Referat Inline Roughness Measurement Using Laser Speckle Correlation

ENG Referat Optosurf – Scattered Light Measurement for Roughness, Form and Waviness.

ENG Referat Taming the Beast of Roughness Measurement – With Just One Click

ENG Referat High-level 3D surface analysis with true color coded 3D point clouds (RGBD)

ENG Referat Q&A Session 3

ENG Referat Latest Developement in CT Metrology

ENG Referat Camera Tomography: A new method to detect external & internal defects in-line

ENG Referat Production Ready CT Scans in 0.1sec

ENG Referat Beyond Visual Inspection: AI-powered Acoustic Testing for Structural Metal Defects

ENG Referat Hyperspectral Vision – Fast optical metrology for thin layers and surfaces

ENG Referat Inline Inspection & Metrology – From corporate to stand alone

ENG Referat Virtual Clamping – The End of Physical Measurement Fixtures?

Weitere Vorträge

Welcome

Keynote: Unconventional Optical Metrology – New Possibilities Beyond C ...

Enhancing 3D Metrology in Logistics and Vision Guided Robotics with 3D Sensors

Automated Virtual Clamping for ZEISS ScanBox Technology

3D – Scanning with laser or fringe projection – What is better?

Q&A Session 1

Inline 3D-Microsopy with up to 60 Mio points per second

AI Cameras are Redefining how Manufacturers detect Defects & ensure Quality

Q&A Session 2

Inline Roughness Measurement Using Laser Speckle Correlation

Optosurf – Scattered Light Measurement for Roughness, Form and Waviness.

Taming the Beast of Roughness Measurement – With Just One Click

High-level 3D surface analysis with true color coded 3D point clouds (RGBD)

Q&A Session 3

Latest Developement in CT Metrology

Camera Tomography: A new method to detect external & internal defects i ...

Production Ready CT Scans in 0.1sec

Beyond Visual Inspection: AI-powered Acoustic Testing for Structural Metal D ...

Hyperspectral Vision – Fast optical metrology for thin layers and surfaces

Inline Inspection & Metrology – From corporate to stand alone

Virtual Clamping – The End of Physical Measurement Fixtures?

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ENG Webinar
Welcome

ENG Referat
Keynote: Unconventional Optical Metrology – New Possibilities Beyond Classical Systems

ENG Referat
Enhancing 3D Metrology in Logistics and Vision Guided Robotics with 3D Sensors

ENG Referat
Automated Virtual Clamping for ZEISS ScanBox Technology

ENG Referat
3D – Scanning with laser or fringe projection – What is better?

ENG Referat
Q&A Session 1

ENG Referat
Inline 3D-Microsopy with up to 60 Mio points per second

ENG Referat
AI Cameras are Redefining how Manufacturers detect Defects & ensure Quality

ENG Referat
Q&A Session 2

ENG Referat
Inline Roughness Measurement Using Laser Speckle Correlation

ENG Referat
Optosurf – Scattered Light Measurement for Roughness, Form and Waviness.

ENG Referat
Taming the Beast of Roughness Measurement – With Just One Click

ENG Referat
High-level 3D surface analysis with true color coded 3D point clouds (RGBD)

ENG Referat
Q&A Session 3

ENG Referat
Latest Developement in CT Metrology

ENG Referat
Camera Tomography: A new method to detect external & internal defects in-line

ENG Referat
Production Ready CT Scans in 0.1sec

ENG Referat
Beyond Visual Inspection: AI-powered Acoustic Testing for Structural Metal Defects

ENG Referat
Hyperspectral Vision – Fast optical metrology for thin layers and surfaces

ENG Referat
Inline Inspection & Metrology – From corporate to stand alone

ENG Referat
Virtual Clamping – The End of Physical Measurement Fixtures?