inVISION Day Metrology
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02.04.2025
09:00Uhr (MEZ)
At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and of course various presentations.
Moderation:
Peter Ebert
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Keynote: Unconventional Optical Metrology – New Possibilities Beyond Classical Systems
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