inVISION Day Metrology
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02.04.2025
09:00Uhr (MEZ)
At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and of course various presentations.

Moderation:
Peter Ebert
EMVA
Welcome
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Keynote: Unconventional Optical Metrology – New Possibilities Beyond Classical Systems
Photoneo
Enhancing 3D Metrology in Logistics and Vision Guided Robotics with 3D Sensors
Protos-3D Metrology GmbH
Automated Virtual Clamping for ZEISS ScanBox Technology
Me-go
3D – Scanning with laser or fringe projection – What is better?
Wird bekannt gegeben
Q&A
AIT Austrian Institute of Technology GmbH
Inline 3D-Microsopy with up to 60 Mio points per second
Eleven Dynamics
AI Cameras are Redefining how Manufacturers detect Defects & ensure Quality
Wird bekannt gegeben
Q&A
Fraunhofer IPM
Inline Roughness Measurement Using Laser Speckle Correlation
Mahr
Optosurf – Scattered Light Measurement for Roughness, Form and Waviness.
Bruker Alicona
Taming the Beast of Roughness Measurement – With Just One Click
K-Lens
High-level 3D surface analysis with true color coded 3D point clouds (RGBD)
Wird bekannt gegeben
Q&A
Wenzel Metrology
Latest Developement in CT Metrology
Tenta Vision
Camera Tomography: A new method to detect external & internal defects in-line
Lumafield
Production Ready CT Scans in 0.1sec
Wird bekannt gegeben
Q&A
Ommatidia Lidar
High-precision parallel LiDAR technology for high-resolution measurements
Resoniks
Beyond Visual Inspection: AI-powered Acoustic Testing for Structural Metal Defects
Dive Imaging
Hyperspectral Vision – Fast optical metrology for thin layers and surfaces
NEWSTON Automated Solutions GmbH
Inline Inspection & Metrology – From corporate to stand alone
Eleven Dynamics / Duwe-3D / Hexagon / Zeiss
Virtual Clamping – The End of Physical Measurement Fixtures?
Hallo
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