inVISION Day Metrology
![Webinar - Featureimage](https://openwebinarworld.com/wp-content/uploads/2024/01/Zeiss-768x511.jpeg)
Bild: © Carl Zeiss Industrielle Messtechnik
16.05.2024
9:15 AM (CET)
At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and the EMVA Pitches, where four start-up companies will present their innovations.
![Webinar - Moderator-image](https://openwebinarworld.com/wp-content/uploads/2023/12/Peter-Ebert-3c-2021TeDo-Verlag_webinar_120x120px-1.jpeg)
Moderation:
Dr.-Ing. Peter Ebert
Topics:
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To be announced
Trends in Intelligent Metrology & Quality Sensing Systems
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To be announced
Session 1: 3D Scanners
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To be announced
Session 2: Inline Metrology
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To be announced
Session 3: Surface Metrology
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To be announced
Session 4: CT & X-ray
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To be announced
Panel Discussion: Using AI in dimensional Metrology
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To be announced
EMVA Innovations
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Session 1: 3D Scanner
AT Automation Technology, Hexagon, Saccade Vision
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Session 2: Inline Metrology
Nikon, Micro-Epsilon, Eleven Dynamics, Automated Precision Europe
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Session 3: Surface Metrology
Opto, Heliotis, Mahr, Precitec/Enovasense
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Session 4: CT & X-ray
Fraunhofer EZRT / X-ray Lab
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