inVISION Day Metrology
Bild: © Carl Zeiss Industrielle Messtechnik
16.05.2024
9:15 AM (CET)
At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and the EMVA Pitches, where four start-up companies will present their innovations.
Moderation:
Dr.-Ing. Peter Ebert
WZL - RWTH Aachen University
Intelligent metrology for trustworthy digitalization & production of the future
Automation Technology GmbH
Innovative Metrology Software Enables Super Fast 3D Evaluation
Hexagon
Structured light scanning made easy
Saccade
High-resolution 3D imaging of highly reflective objects with MEMS-based 3D scanning profil
Nikon
Laser Radar Metrology in EV Produktion
Micro-Epsilon
Inline 3D Measurements
Eleven Dynamics
Universal Compatibility with any Robot, Software & Sensor
Automated Precision Europe
Efficiency through Integrated API Measurement Solutions for Automation
Opto GmbH
Fast Anomaly detection on technical surfaces
Heliotis
High-resolution 3D sensors for automated inspection of microstructures and surfaces
Mahr GmbH
Modern surface measurement technologies
Precitec/Enovasense
Enovasense Field sensor : a breakthrough in high resolution under surface analysis
Fraunhofer EZRT
Boost your CT inspection: Up to 60% efficiency increase without hard- or software changes
TeDo Verlag
EMVA Innovations
LMI Technologies/Zeiss/VisiConsult/Hexagon
Using AI in dimensional Metrology
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