inVISION Day Metrology
Bild: © Carl Zeiss Industrielle Messtechnik
16.05.2024
09:15Uhr (MEZ)
At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and the EMVA Pitches, where four start-up companies will present their innovations.
Moderation:
Dr.-Ing. Peter Ebert
Themen:
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WZL - RWTH Aachen University
Intelligent metrology for trustworthy digitalization & production of the future
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Automation Technology GmbH
Innovative Metrology Software Enables Super Fast 3D Evaluation
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Hexagon
Structured light scanning made easy
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Saccade
High-resolution 3D imaging of highly reflective objects with MEMS-based 3D scanning profil
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Nikon
Laser Radar Metrology in EV Produktion
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Micro-Epsilon
Inline 3D Measurements
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Eleven Dynamics
Universal Compatibility with any Robot, Software & Sensor
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Automated Precision Europe
Efficiency through Integrated API Measurement Solutions for Automation
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Opto GmbH
Fast Anomaly detection on technical surfaces
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Heliotis
High-resolution 3D sensors for automated inspection of microstructures and surfaces
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Session 1: 3D Scanner
AT Automation Technology, Hexagon, Saccade Vision
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Session 2: Inline Metrology
Nikon, Micro-Epsilon, Eleven Dynamics, Automated Precision Europe
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Session 3: Surface Metrology
Opto, Heliotis, Mahr, Precitec/Enovasense
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Session 4: CT & X-ray
Fraunhofer EZRT / X-ray Lab
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Weitere Referatsthemen und Referenten werden noch bekannt gegeben.
Hallo
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