inVISION Day Metrology

At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and the EMVA Pitches, where four start-up companies will present their innovations.

Moderation:

Dr.-Ing. Peter Ebert