inVISION Day Metrology
Bild: ©AkeDynamic/stock.adobe.com
26.04.2023
9:15 AM (CET)
At the first inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, the panel discussion 'Metrology in the Digital Age' and the EMVA Pitches, where four start-up companies will present their innovations. You can find more information under invdays.com/metrology
Moderation:
Dr.-Ing. Peter Ebert
Fraunhofer IFF
Keynote: Metrology vs. Testing – Trends in Automation Technology determine the Requirement
Automation Technology
Evaluate Your 3D Image Within 10 Minutes
Saccade
Integrating Optical 3D Metrology into Precise Manufacturing Process
Micro-Epsilon
Uniform evaluation software for 3D sensor technology
Heliotis
Micro Scale 3D Metrology
Zeiss
Metrology goes inline: Process Monitoring. Inline Metrology. One single cell.
Eleven Dynamics / MQS
Open 4.0 Platform for Automated Metrology in Smart Factories
Precitec
Precision, Speed, and Efficiency: The Cutting-Edge Sensors for challenging Industrial Appl
Zeiss
Smart Process Control: Fully automated surface inspection in car body construction.
Polytec
Reliable Surface Quality Inspections and Pass-fail Analysis
Zeiss
Up to 100x Productivity Improvements for X-ray Microscopy using AI reconstruction
Volume Graphics
CT meets CAE simulation
Recendt
Terahertz CT with high accuracy
Smarttech
Why colour 3D scanning is important also in industry
Mapvision
Metrology-aided flexible Manufacturing
8Tree
Precision 3D Measurements- as simple as taking a photo
Teratonics
Pulsed Terahertz for Online Control and Inspection
Hexagon / Zeiss / Mitutoya
Panel Discussion: Metrology in the Digital Age
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