inVISION Day Metrology

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webinar-language-icon 26.04.2023

9:15 AM (CET)

At the first inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, the panel discussion 'Metrology in the Digital Age' and the EMVA Pitches, where four start-up companies will present their innovations. You can find more information under invdays.com/metrology

Moderation:

Dr.-Ing. Peter Ebert

Topics:

Session 1: 3D Scanner
AT Automation Technology, Saccade Vision, Micro-Epsilon
Session 2: Inline Metrology
Heliotis, Zeiss, Eleven Dynamics/MQS
Session 3: Surface Metrology
Precitec, Zeiss, Polytec
Session 4: CT & X-ray
Zeiss, Volume Graphics, Recendt

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