inVISION Day Metrology
26.04.2023
09:15Uhr (MEZ)
At the first inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, the panel discussion 'Metrology in the Digital Age' and the EMVA Pitches, where four start-up companies will present their innovations. You can find more information under invdays.com/metrology

Moderation:
Dr.-Ing. Peter Ebert
Themen:
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Session 1: 3D Scanner
AT Automation Technology, Saccade Vision, Micro-Epsilon
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Session 2: Inline Metrology
Heliotis, Zeiss, Eleven Dynamics/MQS
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Session 3: Surface Metrology
Precitec, Zeiss, Polytec
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Session 4: CT & X-ray
Zeiss, Volume Graphics, Recendt
Hallo
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Event-Videothek
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Welcome

Keynote: Metrology vs. Testing – Trends in Automation Technology determine the Requirements for Optical Metrology Systems

Panel Discussion: Metrology in the Digital Age
Session 1: 3D Scanner

Evaluate Your 3D Image Within 10 Minutes

Integrating Optical 3D Metrology into Precise Manufacturing Process

Uniform evaluation software for 3D sensor technology
Session 2: Inline Metrology

Micro Scale 3D Metrology

Metrology goes inline: Process Monitoring. Inline Metrology. One single cell.

Open 4.0 Platform for Automated Metrology in Smart Factories
Session 3: Surface Metrology

Precision, Speed, and Efficiency: The Cutting-Edge Sensors for challenging Industrial Applications

Smart Process Control: Fully automated surface inspection in car body construction.

Reliable Surface Quality Inspections and Pass-fail Analysis
Session 4: CT & X-ray

Up to 100x Productivity Improvements for X-ray Microscopy using AI reconstruction

CT meets CAE simulation

Terahertz CT with high accuracy
Innovations – presented by EMVA

Why colour 3D scanning is important also in industry

Metrology-aided flexible Manufacturing

Precision 3D Measurements- as simple as taking a photo
