inVISION Day Metrology
Bild: ©AkeDynamic/stock.adobe.com
26.04.2023
09:15Uhr (MEZ)
At the first inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, the panel discussion 'Metrology in the Digital Age' and the EMVA Pitches, where four start-up companies will present their innovations.
Moderation:
Dr.-Ing. Peter Ebert
Themen:
-
Session 1: 3D Scanner
AT Automation Technologies, Saccade Vision, Micro-Epsilon
-
Session 2: Inline Metrology
Heliotis, Zeiss, Eleven Dynamics, MQS
-
Session 3: Surface Metrology
Precitec, Zeiss
-
Session 4: CT & X-ray
Zeiss, Volume Graphics
Konto anlegen
Du bist bereits Mitglied? Einloggen
Wenn Du an einem TechTalk teilnehmen möchtest, brauchen wir alle Angaben, die mit einem Sternchen gekennzeichnet sind...
