Beliebt

405 Minuten

Englisch

Kostenlos

inVISION Day Metrology

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Bild: ©AkeDynamic/stock.adobe.com

webinar-language-icon26.04.2023

09:15Uhr (MEZ)

At the first inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, the panel discussion 'Metrology in the Digital Age' and the EMVA Pitches, where four start-up companies will present their innovations. You can find more information under invdays.com/metrology

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Moderation:

Dr.-Ing. Peter Ebert

Themen:

  • Fraunhofer IFF

    Keynote: Metrology vs. Testing – Trends in Automation Technology determine the Requirement

  • Automation Technology

    Evaluate Your 3D Image Within 10 Minutes

  • Saccade

    Integrating Optical 3D Metrology into Precise Manufacturing Process

  • Micro-Epsilon

    Uniform evaluation software for 3D sensor technology

  • Heliotis

    Micro Scale 3D Metrology

  • Zeiss

    Metrology goes inline: Process Monitoring. Inline Metrology. One single cell.

  • Eleven Dynamics / MQS

    Open 4.0 Platform for Automated Metrology in Smart Factories

  • Precitec

    Precision, Speed, and Efficiency: The Cutting-Edge Sensors for challenging Industrial Appl

  • Zeiss

    Smart Process Control: Fully automated surface inspection in car body construction.

  • Polytec

    Reliable Surface Quality Inspections and Pass-fail Analysis

  • Referent-Logo

    Session 1: 3D Scanner

    AT Automation Technology, Saccade Vision, Micro-Epsilon

  • Referent-Logo

    Session 2: Inline Metrology

    Heliotis, Zeiss, Eleven Dynamics/MQS

  • Referent-Logo

    Session 3: Surface Metrology

    Precitec, Zeiss, Polytec

  • Referent-Logo

    Session 4: CT & X-ray

    Zeiss, Volume Graphics, Recendt

  • Weitere Referatsthemen und Referenten werden noch bekannt gegeben.

Event-Videothek

Zum ansehen der Videos musst Du auf der Open Webinar World angemeldet und für dieses Webinar registriert sein.

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Welcome

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Keynote: Metrology vs. Testing – Trends in Automation Technology determine the Requirements for Optical Metrology Systems

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Panel Discussion: Metrology in the Digital Age

Session 1: 3D Scanner

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Evaluate Your 3D Image Within 10 Minutes

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Integrating Optical 3D Metrology into Precise Manufacturing Process

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Uniform evaluation software for 3D sensor technology

Session 2: Inline Metrology

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Micro Scale 3D Metrology

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Metrology goes inline: Process Monitoring. Inline Metrology. One single cell.

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Open 4.0 Platform for Automated Metrology in Smart Factories

Session 3: Surface Metrology

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Precision, Speed, and Efficiency: The Cutting-Edge Sensors for challenging Industrial Applications

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Smart Process Control: Fully automated surface inspection in car body construction.

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Reliable Surface Quality Inspections and Pass-fail Analysis

Session 4: CT & X-ray

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Up to 100x Productivity Improvements for X-ray Microscopy using AI reconstruction

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CT meets CAE simulation

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Terahertz CT with high accuracy

Innovations – presented by EMVA

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Why colour 3D scanning is important also in industry

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Metrology-aided flexible Manufacturing

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Precision 3D Measurements- as simple as taking a photo

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Pulsed Terahertz for Online Control and Inspection