inVISION Day Metrology
Bild: ©AkeDynamic/stock.adobe.com
26.04.2023
09:15Uhr (MEZ)
At the first inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, the panel discussion 'Metrology in the Digital Age' and the EMVA Pitches, where four start-up companies will present their innovations. You can find more information under invdays.com/metrology
Moderation:
Dr.-Ing. Peter Ebert
Themen:
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Fraunhofer IFF
Keynote: Metrology vs. Testing – Trends in Automation Technology determine the Requirement
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Automation Technology
Evaluate Your 3D Image Within 10 Minutes
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Saccade
Integrating Optical 3D Metrology into Precise Manufacturing Process
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Micro-Epsilon
Uniform evaluation software for 3D sensor technology
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Heliotis
Micro Scale 3D Metrology
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Zeiss
Metrology goes inline: Process Monitoring. Inline Metrology. One single cell.
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Eleven Dynamics / MQS
Open 4.0 Platform for Automated Metrology in Smart Factories
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Precitec
Precision, Speed, and Efficiency: The Cutting-Edge Sensors for challenging Industrial Appl
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Zeiss
Smart Process Control: Fully automated surface inspection in car body construction.
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Polytec
Reliable Surface Quality Inspections and Pass-fail Analysis
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Session 1: 3D Scanner
AT Automation Technology, Saccade Vision, Micro-Epsilon
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Session 2: Inline Metrology
Heliotis, Zeiss, Eleven Dynamics/MQS
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Session 3: Surface Metrology
Precitec, Zeiss, Polytec
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Session 4: CT & X-ray
Zeiss, Volume Graphics, Recendt
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Weitere Referatsthemen und Referenten werden noch bekannt gegeben.
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