Electronics
Bild: ©xiaoliangge/stock.adobe.com / Precitec Optronik GmbH
31.10.2023
14:00Uhr (MEZ)
There are completely different systems for inspecting electronic components and wafers, some of which will be briefly presented in the following webinar. This ranges from AOI systems to thermography or fast metrology or machine vision systems.
Moderation:
Dr. -Ing. Peter Ebert
Themen:
-
InfraTec
Thermographic Measurements for Reliable Electronics Design and Operation
-
Vision & Control
Telecentric Optical Systems for End-of-Line (EoL) Inspection in Electronics Manufacturing
-
Opto GmbH
New image-based metrology technologies to automate semiconductor test processes
Hallo
Bei den TechTalks einloggen oder Konto erstellen
